The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
Publisher: Springer International Publishing AG
Author(s): Matthias Thiele
Illustration(s): 95 Illustrations, color; 4 Illustrations, black and white; XIII, 159 p. 99 illus., 95 illus. in color.